Catalog
Number

     Description

Price

Each of the following specimens is securely affixed to an aluminum SEM specimen mount.
Please specify type specimen mount you need.

64000

Low Magnification Calibration Specimen - Precision 400 mesh copper screening and 1000 mesh nickel screening is affixed to a specimen mount to aid in calibrating specimens at magnifications from 50x to 1000x.

$35.75

64015

Composite Magnification Test Specimen - Composed of three magnification specimens attached firmly to a scanning microscope specimen mount. One specimen is 400 mesh copper screening for low magnification work. The middle specimen is a 15,240 line per inch grating for the high magnification range. The third specimen is a 1,500 mesh nickel screening for the middle magnification range. 50 mesh screening is placed over entire grating for strength. This composite specimen is both a time and space saver. Measurement charts and instructions for use included.

$115.00

64005

Grating - 15,240 lines per inch - Made specifically for use in SEM's. This replica is taken from a ruled diffraction grating with 15,240 lines per inch. Very useful for magnification determination in the range of 1000x to 15,000x. A 50 mesh screen is placed over entire grating for strength. Measurement chart and instructions included.

$58.95

64007

Grating - 28,800 lines per inch - Replica taken from a ruled diffraction grating. Useful for magnification of 3000x to 30,000x. A 50 mesh screen is placed over entire grating for strength. Measurement chart and instructions included.

$58.95

64010

Grating - "Waffle" - Replica specifically made for SEM use is taken from a ruled diffraction grating with two sets of lines ruled at right angles to each other. There are 54,864 lines per inch in both directions. A 50 mesh screen is placed over entire grating for strength. Useful for magnification determination, detection and measurement of lens distortion, and the determination of the degree of fore-shortening in an image, as a function of specimen tilt. Measurement chart and instructions included.

$59.95

53130

SEM Performance Standard - A test and performance sample for the SEM. Vapor deposited aluminum on a silicon substrate. Photo lithographed and etched. Ten separate measurements and tests may be performed with this one standard. Dimensions are printed near each target area. May be used for magnification calibration, magnification center and scan rotation center, geometry errors and pin cushion distortion, depth of field measurements, dynamic focus performance and tilt correction, orthogonality and linearity tests, stage motion tests and video performance and video loop stability.  Instructions included. Please specify type of specimen mount required.

$1025.00

64025

Image Quality Checker - A specimen of 200 mesh gold screening is firmly affixed to an SEM specimen mount. This provides a quick method of determining image quality. Good surface detail discernible at reasonably high magnification. Will not oxidize. Please state specimen mount required.

$34.95

53156

Platinum/Iridium Coated Holey Carbon Film - Metal particles provide for resolution checks while holes correct astigmatism and make focusing easier. Mounted on a 3.0 mm diameter grid.

$29.95

53170

SEM Test Standard - Produced by electron beam lithography on a silicon single crystal wafer. The standard is composed of three orders of magnitude of checkerboard patterns which allow highly precise measurements. Each standard is one square centimeter placed on the specimen mount of your choice. This is comprised of a 10 x 10 field of one square millimeter. Each square millimeter is comprised of a 10 x 10 field of 0.1 millimeter (100 µm) size - which are again comprised of 0.01 millimeter (10 µm) squares.  A total of 125,000 deep-etched squares of 10 x 10 µm show crisp contrast. The periodic structures have an angular precision of approximately 0.2 µm and an angular precision of approximately 5 arc seconds. A specimen may be placed directly on the wafer for accurate measurements. Useful for magnification determination, image distortion, image resolution and selected area diffraction. Normal and electrom beam contamination are easily cleaned from wafer surface. Specify specimen mount required.

$1820.00