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The Tripod Polisher was designed by researchers at
the IBM East Fishkill Laboratory to accurately prepare TEM and SEM samples of pre-specified, micron-sized regions. For TEM Samples, this technique has been used successfully to limit ion
milling times to less than 15 minutes and, in some cases, has eliminated the need for ion milling. Although this technique was designed for preparing semiconductor
cross-sections, it has been used to prepare both plan-view and cross-section samples from such diverse materials as ceramics, composites, metals and geological samples.
For your convenience we now offer three different versions of the Tripod Polisher. L590TS
- Tripod Polisher for SEM and TEML590TEM
- Tripod Polisher for Transmission Electron Microscopy L590SEM
- Tripod Polisher for Scanning Electron Microscopy |
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